Abstract

The XRD technique provides information about various structural parameters, including crystallite size, internal strain (stress), crystal structure, interatomic spacing (i.e., interplanar distance), and lattice plane orientation. It confirms the presence of impurity phases in the crystal. The different characteristic peaks of the FTIR spectrum of the sample identify the presence of different groups, molecules, and give information about the crystal structure. SEM and FE-SEM are useful techniques to confirm the morphology of the sample and material composition. The two-probe method is very useful to measure the DC electrical resistivity of the sample. Dielectric parameters confirm dielectric behaviour of the sample. The VSM is used for the investigation of magnetic properties of materials, and we can estimate different magnetic parameters such as saturation magnetization, coercivity, retentivity, and isotropic constant.